Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
The critical behaviour at the displacive ljmit of a model for structural phase transitions is investigated. The static exponents and the parameter values for which this limit is reached are different for classical and for quantum systems. © 1976, Taylor & Francis Group, LLC. All rights reserved.
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
K.N. Tu
Materials Science and Engineering: A
Robert W. Keyes
Physical Review B
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ACS Nano