Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Electron-energy-loss measurements on cleaved Si(111) 2×1 surfaces show a temperature dependence in the position and shape of the absorption edge of the 0.5-eV surface-state transition. The observed trends in the onset line shape provide experimental evidence for surface-state excitonic polarons. In addition, a lower-lying, defect-related surface-state transition at 0.35 eV is studied at low temperature and found to have localized character. © 1985 The American Physical Society.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
R. Ghez, M.B. Small
JES
R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP