Techniques of flash radiometry

Abstract

We analyze in detail flash radiometry techniques for the remote sensing of spectroscopic and physical properties of thin condensed matter samples. Such techniques rely on the transient infrared radiation from the sample heated by a short-duration pulsed radiation. Exact analytical solutions for the conventional transmission radiometry technique (in which the excitation source and the infrared detector are on opposite sides of the sample) as well as the new backscattering radiometry technique (in which the excitation source and the detector are on the same side of the sample) are presented with the effect of heat loss neglected. The analysis allows the determination of the thermal diffusivity or thickness, as well as the absorption coefficients at the excitation wavelength and at the detecting wavelength of the sample from the experimental radiometry profile. The effects of excitation pulse duration and finite rise time of the detection system are discussed. Experiments with pulsed radiometry measurements on thin-film samples are performed to verify some of these theoretical predictions. Radiation loss and lateral heat diffusion loss are shown to be negligible for thin-film samples.