John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence
No abstract available.
John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence
Harpreet S. Sawhney
IS&T/SPIE Electronic Imaging 1994
James Lee Hafner
Journal of Number Theory
Fernando Martinez, Tao Li, et al.
ICLR 2026