PaperAn information statistics approach to data stream and communication complexityZiv Bar-Yossef, T.S. Jayram, et al.Journal of Computer and System Sciences
PaperAiry stress function for atomic modelsPaul J. Steinhardt, P. ChaudhariJournal of Computational Physics
Conference paperBetter on wafer performance and mask manufacturability of contacts with no or non-traditional serifsDonald Samuels, Ian StobertSPIE Photomask Technology + EUV Lithography 2007
Conference paperCharacterization of photoresist spatial resolution by interferometric lithographyJohn A. Hoffnagle, William D. Hinsberg, et al.Microlithography 2003
