About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Paper
SURFACE-TEMPERATURE MEASUREMENT DURING PULSED LASER-INDUCED THERMAL DESORPTION OF XENON FROM A COPPER FILM.
Abstract
Surface temperatures during pulsed laser-induced thermal desorption of xenon from a 28-mm-thick copper film are determined directly with a pyroelectric calorimeter as the substrate. Simultaneously, time-of-flight data of desorbed xenon atoms are recorded with a quadrupole mass spectrometer. From these data equivalent surface temperatures and heating rates can be derived. The calorimetric temperatures are compared with temperatures derived from time-of-flight data.