H. Rohrer, Ch. Gerber
Journal of Applied Physics
We discuss the potential of a new technique for surface imaging on an atomic scale: scanning tunneling microscopy. Examples for 3D topographies of surfaces and work-function profiles are given. © 1983.
H. Rohrer, Ch. Gerber
Journal of Applied Physics
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EPL
P. Vettiger, J. Brugger, et al.
Microelectronic Engineering
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