M.I. Lutwyche, G. Cross, et al.
ISSCC 2000
We discuss the potential of a new technique for surface imaging on an atomic scale: scanning tunneling microscopy. Examples for 3D topographies of surfaces and work-function profiles are given. © 1983.
M.I. Lutwyche, G. Cross, et al.
ISSCC 2000
Ch. Gerber, G. Binnig, et al.
Review of Scientific Instruments
H. Rohrer
Physical Review Letters
G. Binnig
Ultramicroscopy