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PaperSub-aångstrom resolution using aberration corrected electron opticsP.E. Batson, N. Dellby, et al.Nature
PaperProgress in aberration-corrected scanning transmission electron microscopyN. Dellby, L. Krivaneka, et al.Journal of Electron Microscopy
PaperEffects of detector black level in ADF-STEM imagingZhiheng Yu, Philip Batson, et al.Microscopy and Microanalysis
