PublicationMicroscopy and MicroanalysisPaperSub-angstrom probe size in HADF-STEM at 120KVMicroscopy and MicroanalysisDownload paperAbstractNo abstract available.Home↳ PublicationsDate01 Nov 2002PublicationMicroscopy and MicroanalysisAuthorsPhilip BatsonN. DellbyO.L. KrivanekIBM-affiliated at time of publicationResourcesPublicationShare
