Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
In a series of experiments involving IR spectroscopy, Raman spectroscopy, scanning tunneling microscopy and measurements of the near-edge X-ray fine structure, many new details of the structure of Langmuir-Blodgett films have been obtained. The methods and the results giving orientation of the chains, their packing and the head group attachment are described, as well as other properties such as phase transitions. © 1987.
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
R. Ghez, J.S. Lew
Journal of Crystal Growth
U. Wieser, U. Kunze, et al.
Physica E: Low-Dimensional Systems and Nanostructures