Conference paper
Single and dual wavelength exposure of photoresist
J. LaRue, C. Ting
Proceedings of SPIE 1989
Paper
Statistical inference for masked data
Abstract
No abstract available.
Related
W.C. Tang, H. Rosen, et al.
SPIE Optics, Electro-Optics, and Laser Applications in Science and Engineering 1991
Conference paper
Modeling UpLink power control with outage probabilities
Kenneth L. Clarkson, K. Georg Hampel, et al.
VTC Spring 2007
John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence