Conference paper
Convergence properties of multi-dimensional stack filters
Peter Wendt
Electronic Imaging: Advanced Devices and Systems 1990
No abstract available.
Peter Wendt
Electronic Imaging: Advanced Devices and Systems 1990
Arnon Amir, Michael Lindenbaum
IEEE Transactions on Pattern Analysis and Machine Intelligence
Richard M. Karp, Raymond E. Miller
Journal of Computer and System Sciences
Ligang Lu, Jack L. Kouloheris
IS&T/SPIE Electronic Imaging 2002