Olav Hellwig, Dieter Weller, et al.
Applied Physics Letters
Various spectroscopy, imaging, and scattering techniques exploit core-level resonances accessible in the soft X-ray energies to obtain magnetic information in thin films with elemental specificity. In this paper, we describe the emerging technique of resonant soft X-ray small-angle scattering (SAS) as a probe of magnetic and chemical variations in recording media on the nanometer scale. In particular, we characterize the grain size of a CoB-Pd multilayer media and magnetic and chemical grain sizes in perpendicular CoPtCr media.
Olav Hellwig, Dieter Weller, et al.
Applied Physics Letters
J.B. Kortright, Sang-Koog Kim, et al.
Physical Review B - CMMP
S. Maat, O. Hellwig, et al.
Physical Review B - CMMP
Kentaro Takano, G. Zeltzer, et al.
Journal of Applied Physics