Conference paperDetermination of thickness errors and boundary roughness from the measured performance of a multilayer coatingEberhard Spiller, Alan E. RosenbluthProceedings of SPIE 1989
Conference paperExperience with the in situ monitor system for the fabrication of x-ray mirrorsEberhard SpillerProceedings of SPIE 1989
Conference paperImaging performance of a normal incidence x-ray telescope measured at 0.18 kevJ.P. Henry, Eberhard Spiller, et al.Proceedings of SPIE 1989