Publication
IEEE Transactions on Magnetics
Paper

Small magnetic patterns written with a scanning tunneling microscope

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Abstract

This paper presents a technique for writing submicron magnetic bit patterns on double-layered perpendicular recording media by using a Scanning Tunneling Microscope (STM) with an amorphous magnetic tip and observing them with a Magnetic Force Microscope (MFM). The proposed technique provides a very small tip-to-medium spacing on the order of Angstroms. © 1991 IEEE

Date

01 Jan 1991

Publication

IEEE Transactions on Magnetics

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