Small magnetic patterns written with a scanning tunneling microscope

Abstract

This paper presents a technique for writing submicron magnetic bit patterns on double-layered perpendicular recording media by using a Scanning Tunneling Microscope (STM) with an amorphous magnetic tip and observing them with a Magnetic Force Microscope (MFM). The proposed technique provides a very small tip-to-medium spacing on the order of Angstroms. © 1991 IEEE