PublicationMicroscopy and MicroanalysisPaperSimultaneous high-speed DualEELS and EDS acquisition at atomic levelMicroscopy and MicroanalysisDownload paperAbstractNo abstract available.Home↳ PublicationsDate27 Aug 2014PublicationMicroscopy and MicroanalysisAuthorsP. LongoT. TopuriaP. RiceA. AitouchenP.J. ThomasR.D. TwestenIBM-affiliated at time of publicationResourcesPublicationShare
