J.W.M. Frenken, R.J. Hamers, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
An improved five-wavelength interferometer with high-speed shutters in the light path was designed and implemented. The interferometer allows switching between two sets of three wavelengths, keeping one wavelength in each measurement in common. The set-up allows nearly simultaneous acquisition of fringe intensities and can be used to measure the head/tape spacing in a moving linear tape drive. The precision of the new five-wavelength interferometer was investigated and was found to be superior to the precision obtained with a three-wavelength interferometer.
J.W.M. Frenken, R.J. Hamers, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Antonio Miotello, Roger Kelly
Surface Science
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Edward A. Whittaker, Gary C. Bjorklund
CLEO 1983