Peter J. Price
Surface Science
A model for reactive Schottky barrier formation is proposed and applied to silicide contacts on silicon. Approximate workfunctions calculated assuming a silicon excess near the silicide/silicon interface reconcile measured barrier heights with a simple Schottky description of their energetics. © 1980.
Peter J. Price
Surface Science
J.H. Stathis, R. Bolam, et al.
INFOS 2005
A. Gangulee, F.M. D'Heurle
Thin Solid Films
Ronald Troutman
Synthetic Metals