John G. Long, Peter C. Searson, et al.
JES
A model for reactive Schottky barrier formation is proposed and applied to silicide contacts on silicon. Approximate workfunctions calculated assuming a silicon excess near the silicide/silicon interface reconcile measured barrier heights with a simple Schottky description of their energetics. © 1980.
John G. Long, Peter C. Searson, et al.
JES
T.N. Morgan
Semiconductor Science and Technology
A. Gangulee, F.M. D'Heurle
Thin Solid Films
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering