M. Hargrove, S.W. Crowder, et al.
IEDM 1998
A model for reactive Schottky barrier formation is proposed and applied to silicide contacts on silicon. Approximate workfunctions calculated assuming a silicon excess near the silicide/silicon interface reconcile measured barrier heights with a simple Schottky description of their energetics. © 1980.
M. Hargrove, S.W. Crowder, et al.
IEDM 1998
Michiel Sprik
Journal of Physics Condensed Matter
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010