Conference paper
Multifault testable circuits based on binary parity diagrams
Sandip Kundu
ICCD 1994
In this paper we propose a new self-checking comparator with one periodic output. The comparator can be used as a two-rail checker or as an equality checker. Two different input patterns are sufficient to detect all the faults considered. ©1996 IEEE.
Sandip Kundu
ICCD 1994
D. Brand, A.D. Drumm, et al.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Sandip Kundu, Sudhakar M. Reddy
ICCD 1989
Sandip Kundu, I. Nair, et al.
European Conference on Design Automation 1992