Conference paper
Design of TSC checkers for implementation in CMOS technology
Sandip Kundu, Sudhakar M. Reddy
ICCD 1989
In this paper we propose a new self-checking comparator with one periodic output. The comparator can be used as a two-rail checker or as an equality checker. Two different input patterns are sufficient to detect all the faults considered. ©1996 IEEE.
Sandip Kundu, Sudhakar M. Reddy
ICCD 1989
R. Thomas, Sandip Kundu
European Conference on Design Automation 1992
A. Devgan, Sandip Kundu
ASP-DAC 1998
Sandip Kundu
ISIT 1990