D. Brand, A.D. Drumm, et al.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
In this paper we propose a new self-checking comparator with one periodic output. The comparator can be used as a two-rail checker or as an equality checker. Two different input patterns are sufficient to detect all the faults considered. ©1996 IEEE.
D. Brand, A.D. Drumm, et al.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Sandip Kundu
ISIT 1990
Sandip Kundu, I. Nair, et al.
European Conference on Design Automation 1992
A. Devgan, Sandip Kundu
ASP-DAC 1998