D. Brand, A.D. Drumm, et al.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Paper
Self-checking comparator with one periodic output
Abstract
In this paper we propose a new self-checking comparator with one periodic output. The comparator can be used as a two-rail checker or as an equality checker. Two different input patterns are sufficient to detect all the faults considered. ©1996 IEEE.
Related
Conference paper
Multifault testable circuits based on binary parity diagrams
Sandip Kundu
ICCD 1994
Sandip Kundu, Sudhakar M. Reddy, et al.
ICCAD 1987
Conference paper
Synthesis of fully testable sequential machines
R. Thomas, Sandip Kundu
European Conference on Design Automation 1992