Conference paper
Multifault testable circuits based on binary parity diagrams
Sandip Kundu
ICCD 1994
In this paper we propose a new self-checking comparator with one periodic output. The comparator can be used as a two-rail checker or as an equality checker. Two different input patterns are sufficient to detect all the faults considered. ©1996 IEEE.
Sandip Kundu
ICCD 1994
Sandip Kundu, Uttam Ghoshal
EDTC 1997
R. Thomas, Sandip Kundu
European Conference on Design Automation 1992
Sandip Kundu, Sudhakar M. Reddy, et al.
ICCAD 1987