Conference paper
A small test generator for large designs
Sandip Kundu, Leendert M. Huisman, et al.
IEEE ITC 1992
Paper
Self-checking comparator with one periodic output
Abstract
In this paper we propose a new self-checking comparator with one periodic output. The comparator can be used as a two-rail checker or as an equality checker. Two different input patterns are sufficient to detect all the faults considered. ©1996 IEEE.
Related
Sandip Kundu
ISIT 1990
D. Brand, A.D. Drumm, et al.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Conference paper
Inductance analysis of on-chip interconnects
Sandip Kundu, Uttam Ghoshal
EDTC 1997