Conference paper
Inductance analysis of on-chip interconnects
Sandip Kundu, Uttam Ghoshal
EDTC 1997
In this paper we propose a new self-checking comparator with one periodic output. The comparator can be used as a two-rail checker or as an equality checker. Two different input patterns are sufficient to detect all the faults considered. ©1996 IEEE.
Sandip Kundu, Uttam Ghoshal
EDTC 1997
R. Thomas, Sandip Kundu
European Conference on Design Automation 1992
Sandip Kundu
ISIT 1990
Sandip Kundu
IEICE Transactions on Information and Systems