Khaled A.S. Abdel-Ghaffar
IEEE Trans. Inf. Theory
Paper
Self-assessment procedure XVI: A self-assessment procedure dealing with computer organization and logic design
Abstract
No abstract available.
Related
Thomas R. Puzak, A. Hartstein, et al.
CF 2007
Conference paper
Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
David A. Selby
IBM J. Res. Dev