Sample holder for diffraction and other studies in ultrahigh vacuum

F. Jona; H.R. Wendt

doi:10.1063/1.1684191

Review of Scientific Instruments

Paper

10 Nov 2003

Sample holder for diffraction and other studies in ultrahigh vacuum

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Abstract

A sample holder suitable for ultrahigh vacuum experimentation is described that allows, in addition to translation and tilting, rotation of the sample around two mutually perpendicular axes. © 1969 The American Institute of Physics.

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Abstract

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Accurate calculation of the low-energy electron-diffraction spectra of Al by the layer Korringa-Kohn-Rostoker method

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