Sample holder for diffraction and other studies in ultrahigh vacuum

F. Jona; H.R. Wendt

doi:10.1063/1.1684191

Review of Scientific Instruments

Paper

10 Nov 2003

Sample holder for diffraction and other studies in ultrahigh vacuum

View publication

Abstract

A sample holder suitable for ultrahigh vacuum experimentation is described that allows, in addition to translation and tilting, rotation of the sample around two mutually perpendicular axes. © 1969 The American Institute of Physics.

Paper

Atomic structure of an impurity-stabilized Si{111} surface: Refinement using a combined-layer method

D.W. Jepsen, H.D. Shih, et al.

Physical Review B

Paper

Resonance photoemission at the 2p excitation threshold of Ni{001}

S.C. Wu, C.K.C. Lok, et al.

Physical Review B

Paper

Low-energy electron diffraction study of multilayer relaxation on a Pb{110} surface

Y.S. Li, J. Quinn, et al.

Physical Review B

Paper

Preparation and properties of clean surfaces of aluminum

F. Jona

Journal of Physics and Chemistry of Solids

View all publications

Abstract

Related

Atomic structure of an impurity-stabilized Si{111} surface: Refinement using a combined-layer method

Resonance photoemission at the 2p excitation threshold of Ni{001}

Low-energy electron diffraction study of multilayer relaxation on a Pb{110} surface

Preparation and properties of clean surfaces of aluminum