Sample holder for diffraction and other studies in ultrahigh vacuum

F. Jona; H.R. Wendt

doi:10.1063/1.1684191

Review of Scientific Instruments

Paper

10 Nov 2003

Sample holder for diffraction and other studies in ultrahigh vacuum

View publication

Abstract

A sample holder suitable for ultrahigh vacuum experimentation is described that allows, in addition to translation and tilting, rotation of the sample around two mutually perpendicular axes. © 1969 The American Institute of Physics.

Paper

Step profiles predicted with the modified point-ion model for eight face-centered- and body-centered-cubic surfaces

P. Jiang, F. Jona, et al.

Physical Review B

Paper

A note on the sensitivity of leed to surface perfection

F. Jona

Surface Science

Paper

Quantitative determination of evaporated Si films by neutron activation

R.F. Peart, F. Jona, et al.

Journal of Applied Physics

Paper

Reactions of silicon with surfaces of close-packed metals: Silicon on aluminum

F. Jona

Journal of Applied Physics

View all publications

Abstract

Related

Step profiles predicted with the modified point-ion model for eight face-centered- and body-centered-cubic surfaces

A note on the sensitivity of leed to surface perfection

Quantitative determination of evaporated Si films by neutron activation

Reactions of silicon with surfaces of close-packed metals: Silicon on aluminum