Skip to main content
Research
Focus areas
Blog
Publications
Careers
About
Back
Focus areas
Semiconductors
Artificial Intelligence
Quantum Computing
Hybrid Cloud
Back
About
Overview
Labs
People
Back
Semiconductors
Back
Artificial Intelligence
Back
Quantum Computing
Back
Hybrid Cloud
Back
Overview
Back
Labs
Back
People
Research
Focus areas
Semiconductors
Artificial Intelligence
Quantum Computing
Hybrid Cloud
Blog
Publications
Careers
About
Overview
Labs
People
Open IBM search field
Close
Solid State Electronics
Paper
01 Jan 1993
Reduced hot-carrier reliability degradation of x-ray irradiated MOSFETs in a 0.25 μm CMOS technology with ultra-thin gate oxide
View publication
Abstract
No abstract available.
Related
Talk
Single-Atom Spin Resonance for Quantum Sensing in an STM
Paper
Enhanced Room-Temperature Photoluminescence Quantum Yield in Morphology Controlled J-Aggregates
Talk
Quantized thermal and thermoelectric transport along single molecule junctions
Talk
Super resolving spatial-temporal weather predictions using Deep Learning
View all publications
