Reduced hot-carrier reliability degradation of x-ray irradiated MOSFETs in a 0.25 μm CMOS technology with ultra-thin gate oxide

Hiroshi Ito, Reinhold Schwalm

JES

Eloisa Bentivegna

Big Data 2022

William Hinsberg, Joy Cheng, et al.

SPIE Advanced Lithography 2010

Kigook Song, Robert D. Miller, et al.

Macromolecules