R.M. Feenstra, Joseph A. Stroscio, et al.
Surface Science
The structure of steps on cleaved silicon (111) surfaces is studied by scanning tunneling microscopy. Predominantly [21»1»] oriented steps are observed. Ordered regions of individual steps have unit periodicity along the step edge. A -bonded reconstruction of the step edge is deduced from the images. © 1987 The American Physical Society.
R.M. Feenstra, Joseph A. Stroscio, et al.
Surface Science
R.M. Feenstra, G. Meyer, et al.
Physical Review B - CMMP
C.K. Shih, R.M. Feenstra, et al.
Physical Review B
P.M. Mooney, J.L. Jordan-Sweet, et al.
Applied Physics Letters