Joseph A. Stroscio, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
The structure of steps on cleaved silicon (111) surfaces is studied by scanning tunneling microscopy. Predominantly [21»1»] oriented steps are observed. Ordered regions of individual steps have unit periodicity along the step edge. A -bonded reconstruction of the step edge is deduced from the images. © 1987 The American Physical Society.
Joseph A. Stroscio, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
J.L. Jordan-Sweet, P.M. Mooney, et al.
Journal of Applied Physics
R.M. Feenstra, Joseph A. Stroscio, et al.
Physical Review Letters
M.A. Lutz, R.M. Feenstra, et al.
Surface Science