P.N. First, R.A. Dragoset, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
The structure of steps on cleaved silicon (111) surfaces is studied by scanning tunneling microscopy. Predominantly [21»1»] oriented steps are observed. Ordered regions of individual steps have unit periodicity along the step edge. A -bonded reconstruction of the step edge is deduced from the images. © 1987 The American Physical Society.
P.N. First, R.A. Dragoset, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Joseph A. Stroscio, R.M. Feenstra, et al.
Physical Review B
R.M. Feenstra, J.Y. Lee, et al.
Physical Review B - CMMP
R.M. Feenstra, R.J. Hauenstein, et al.
ICDS 1984