Publication
International Symposium on Methods and Materials in Microelectronic Technology 1982
Conference paper

RECENT ADVANCES IN THE THEORY OF IMPURITIES AND DEFECTS IN SEMICONDUCTORS.

View publication

Abstract

The author discusses work carried out by him and his collaborators in the last few years. He describes research on the shrinkage of the band gap that occurs at high temperatures. He then covers work on deep centers, with emphasis on the interrelations between theory, experiment, and applications.

Date

Publication

International Symposium on Methods and Materials in Microelectronic Technology 1982

Authors

Share