M.A. Lutz, R.M. Feenstra, et al.
Applied Physics Letters
Scanning tunneling microscopy is used to confirm the -bonded chain structure of the Si(111)2×1 surface. Both the amplitude and voltage dependence of the vertical corrugation exclude the buckling model for the structure of this surface. Spectroscopic measurements of the tunneling current versus voltage identify a band gap for the 2×1 surface states. Spatial images of disorder-related states are obtained by tunneling at energies inside of this band gap. © 1986 The American Physical Society.
M.A. Lutz, R.M. Feenstra, et al.
Applied Physics Letters
R.M. Feenstra, W.A. Thompson, et al.
JVSTA
J.L. Jordan-Sweet, P.M. Mooney, et al.
Journal of Applied Physics
Ravi F. Saraf, Steve Ostrander, et al.
Langmuir