T.F. Heinz, M.M.T. Loy, et al.
Physical Review Letters
Scanning tunneling microscopy is used to confirm the -bonded chain structure of the Si(111)2×1 surface. Both the amplitude and voltage dependence of the vertical corrugation exclude the buckling model for the structure of this surface. Spectroscopic measurements of the tunneling current versus voltage identify a band gap for the 2×1 surface states. Spatial images of disorder-related states are obtained by tunneling at energies inside of this band gap. © 1986 The American Physical Society.
T.F. Heinz, M.M.T. Loy, et al.
Physical Review Letters
Joseph A. Stroscio, R.M. Feenstra, et al.
Physical Review B
A.P. Fein, J.R. Kirtley, et al.
Review of Scientific Instruments
Joseph A. Stroscio, D.M. Newns, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films