Publication
IEEE TC
Paper

Random Pattern Testability

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Abstract

A major problem in self testing with random inputs is verification of the test quality, i.e., the computation of the fault coverage. The brute-force approach of using full-fault simulation does not seem attractive because of the logic structure volume, and the CPU time encountered. A new approach is therefore necessary. This paper describes a new analytical method of computing the fault coverage that is fast compared with simulation. If the fault coverage falls below a certain threshold, it is possible to identify the “random-pattern-resistant” faults, modify the logic to make them easy to detect, and thus, increase the fault coverage of the random test. © 1984 IEEE

Date

01 Jan 1984

Publication

IEEE TC

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