J.C. Tsang, M.W. Shafer
Solid State Communications
Raman spectroscopy has been used to observe the C local mode in epitaxial CySi1-y layers grown by molecular beam epitaxy. The scattering cross section per C atom is independent of alloy concentration for y<2%. Lattice relaxation about substitutional C sites induces an extra peak near 475 cm-1.
J.C. Tsang, M.W. Shafer
Solid State Communications
J.A. Kash, S.S. Jha, et al.
Physical Review Letters
G.V.Subba Rao, J.C. Tsang
Materials Research Bulletin
J.A. Kash, R. Ulbrich, et al.
Solid State Electronics