John G. Long, Peter C. Searson, et al.
JES
A phenomenological explanation of Raman scattering in amorphous Si, Ge and III-V semiconductors is given, using Si as an example. Several applications of Raman scattering to the study of amorphous materials are discussed. © 1972.
John G. Long, Peter C. Searson, et al.
JES
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Physics of Fluids
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Surface Review and Letters
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