Joel L. Wolf, Mark S. Squillante, et al.
IEEE Transactions on Knowledge and Data Engineering
The measurement of the actual toner charge distribution, for both positively and negatively charged particles, in an electrophotographic development system would be useful in evaluating and optimizing the development system. We report the development of a charge spectrometer for a contact monocomponent development system, which quantitatively measures the charge distribution for the toner particles, as well as the percentage of wrong-sign toner.
Joel L. Wolf, Mark S. Squillante, et al.
IEEE Transactions on Knowledge and Data Engineering
Alessandro Morari, Roberto Gioiosa, et al.
IPDPS 2011
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Hans Becker, Frank Schmidt, et al.
Photomask and Next-Generation Lithography Mask Technology 2004