S.M. Sadjadi, S. Chen, et al.
TAPIA 2009
Paper
Quality Assurance: Much More than Testing
Abstract
No abstract available.
Related
J.P. Locquet, J. Perret, et al.
SPIE Optical Science, Engineering, and Instrumentation 1998
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Thomas M. Cheng
IT Professional