M. Kläui, P.O. Jubert, et al.
Physical Review Letters
Probing depth of threshold photoemission electron microscopy was discussed. Photon excitation energies of 5 eV were studied. The mechanism responsible for bulk sensitivity was also studied. It was found that the probing depth is of 16.2 nm.
M. Kläui, P.O. Jubert, et al.
Physical Review Letters
R. Allenspach, H. Salemink, et al.
Zeitschrift für Physik B Condensed Matter
P.O. Jubert, R. Allenspach, et al.
Physical Review B - CMMP
O. Fruchart, M. Eleoui, et al.
Applied Physics Letters