Probing depth of threshold photoemission electron microscopy

G.K.L. Marx; P.O. Jubert; A. Bischof; R. Allenspach

doi:10.1063/1.1616651

Applied Physics Letters

Paper

30 Sep 2003

Probing depth of threshold photoemission electron microscopy

View publication

Abstract

Probing depth of threshold photoemission electron microscopy was discussed. Photon excitation energies of 5 eV were studied. The mechanism responsible for bulk sensitivity was also studied. It was found that the probing depth is of 16.2 nm.

Paper

Morphology-induced oscillations of the magnetic anisotropy in ultrathin co films

W. Weber, C.H. Back, et al.

Physical Review Letters

Conference paper

Current induced modifications of domain wall

P.O. Jubert, M. Kläui, et al.

INTERMAG 2005

Paper

Magnetic domain walls in constrained geometries

P.O. Jubert, R. Allenspach, et al.

Physical Review B - CMMP

Paper

Magnetic switching in cobalt films by adsorption of copper

W. Weber, C.H. Back, et al.

Nature

View all publications

Abstract

Related

Morphology-induced oscillations of the magnetic anisotropy in ultrathin co films

Current induced modifications of domain wall

Magnetic domain walls in constrained geometries

Magnetic switching in cobalt films by adsorption of copper