Ronald Troutman
Synthetic Metals
The limits of accuracy in an automatic wavelength-scanning ellipsometer are defined on the basis of measured mechanical properties of the instrument and the geometrical and optical defects of the optical components. A computational procedure is described for obtaining accurate Δ and ψ values by using a matrix model of the instrument, and the areás in which the greatest improvements in accuracy can be achieved are identified. © 1976.
Ronald Troutman
Synthetic Metals
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
C.M. Brown, L. Cristofolini, et al.
Chemistry of Materials
Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano