Practical fault localization with combinatorial test design

Abstract

Combinatorial test design is a well-known effective technique for test planning. However, in order to fully realize its potential in industrial settings, it needs to be considered as an integral part of the end to end testing flow rather than as an isolated component. In this work, we present an automated end to end solution for CTD-based test optimization, generation, execution and fault localization, implemented in an industrial framework. We further report on our initial promising experience in applying it to an industrial product.