PHOTOTHERMAL ANALYSIS OF THIN FILMS.

Abstract

It has been demonstrated that the photothermal analysis of thin films has a unique potential. Even without being able to construct an actual depth profile from photothermal data, mainly due to mathematical problems, valuable insight into the properties of the sample can be gained. In one example the known structure and thermal properties of a composite sample were used to obtain a spectrum of a thin surface layer with an amount of Nd**3** plus ions corresponding to one monolayer. The quantum yield for radiationless decay was obtained. In a second example with well defined optical and overall thermal properties the homogeneity of the doping was proven taking advantage of multiplex excitation.