Conference paper
Electrostatic writing and imaging using a force microscope
F. Saurenbach, B.D. Terris
IAS Annual Meeting 1990
We have used a focused ion beam to directly pattern thin- film granular perpendicular Co70Cr18Pt12 media. By cutting trenches ∼6 nm deep in the ∼20 nm media, we have produced square arrays of magnetically isolated islands with periods in the range 65-500 nm. At periods below ∼130 nm we observe only single magnetic domains, which exhibit a rough "checker-board" pattern of upon ac demagnetization. We have patterned at densities of over 140 Gbit/in2.
F. Saurenbach, B.D. Terris
IAS Annual Meeting 1990
C.T. Rettner, E. Schweizer, et al.
The Journal of Chemical Physics
H. Hou, Y. Huang, et al.
Journal of Chemical Physics
D.J. Auerbach, C.T. Rettner, et al.
Surface Science