J.A. Katine, F.J. Albert, et al.
Digests of the Intermag Conference
Paper
Patterning damage in narrow trackwidth spin-valve sensors
Abstract
Patterning damage in narrow trackwidth spin-valve sensors was studied. The resistance of the sensors increased with the width, while the giant magnetoresistance (GMR) ratio decreased with decreasing width. It was found that sensors patterned using a focused Ar ion beam showed a similar but much greater effect.