H. Liu, D. Bedau, et al.
J Magn Magn Mater
Patterning damage in narrow trackwidth spin-valve sensors was studied. The resistance of the sensors increased with the width, while the giant magnetoresistance (GMR) ratio decreased with decreasing width. It was found that sensors patterned using a focused Ar ion beam showed a similar but much greater effect.
H. Liu, D. Bedau, et al.
J Magn Magn Mater
R.H. Koch, J.A. Katine, et al.
Physical Review Letters
R.E. Fontana, J.A. Katine, et al.
IEEE Transactions on Magnetics
J.A. Katine, F.J. Albert, et al.
INTERMAG 2000