W.H. Rippard, A.C. Perrella, et al.
Applied Physics Letters
Patterning damage in narrow trackwidth spin-valve sensors was studied. The resistance of the sensors increased with the width, while the giant magnetoresistance (GMR) ratio decreased with decreasing width. It was found that sensors patterned using a focused Ar ion beam showed a similar but much greater effect.
W.H. Rippard, A.C. Perrella, et al.
Applied Physics Letters
M.J. Rooks, E. Kratschmer, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
J.A. Katine, M.K. Ho, et al.
INTERMAG 2003
J.A. Katine, Michael Ho, et al.
INTERMAG 2003