U. Dürig, D. Pohl, et al.
Journal of Applied Physics
Subwave length-resolution optical image recording is demonstrated by moving an extremely narrow aperture along a test object equipped with fine-line structures. Details of 25-nm size can be recognized using 488-nm radiation. The result indicates a resolving power of at least λ/20 which is to be compared with the values of λ/2.3 obtainable in conventional optical microscopy.
U. Dürig, D. Pohl, et al.
Journal of Applied Physics
H. Heinzelmann, D. Pohl
Applied Physics A Solids and Surfaces
D. Pohl, L. Novotny, et al.
Thin Solid Films
U. Dürig, O. Züger, et al.
Journal of Microscopy