G.W. Rubloff, P.S. Ho
Thin Solid Films
Surface reflectance spectroscopy is used to determine optical transitions associated with the electronic structure of a W(100) surface during H2 chemisorption. Correlation with photoemission and field-emission data attributes these transitions to excitations from intrinsic and adsorbate-induced levels to final states at the Fermi energy. © 1974 The American Physical Society.
G.W. Rubloff, P.S. Ho
Thin Solid Films
M. Liehr, S. Gates, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
P.S. Ho, G.W. Rubloff
Thin Solid Films
S.S. Dana, M. Anderle, et al.
Applied Physics Letters