P.M. Grant, T. Tani, et al.
Journal of Applied Physics
Paper
Optical properties of polymeric sulfur nitride, (SN)x
Abstract
We report polarized reflectivity measurements on crystalline (SN)x in the range of 0.25-6.0 eV. Our analysis of the data gives ωp=4.6 eV and m*=2me,, values considerably different from those previously reported by other workers. The data also suggest that (SN)x has sufficient electronic dimensionality to suppress a Peierls distortion. © 1975 The American Physical Society.
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