P.M. Chaikin, Mu-Yong Choi, et al.
Physical Review Letters
We report polarized reflectivity measurements on crystalline (SN)x in the range of 0.25-6.0 eV. Our analysis of the data gives ωp=4.6 eV and m*=2me,, values considerably different from those previously reported by other workers. The data also suggest that (SN)x has sufficient electronic dimensionality to suppress a Peierls distortion. © 1975 The American Physical Society.
P.M. Chaikin, Mu-Yong Choi, et al.
Physical Review Letters
Z.Y. Chen, Amlan Biswas, et al.
Journal of Superconductivity
J.L. Brédas, G.B. Street
The Journal of Chemical Physics
Kell Mortensen, M.L.W. Thewalt, et al.
Physical Review Letters