Stephen E. Ralph, D. Grischkowsky
CLEO 1991
Using a source of freely propagating subpicosecond pulses of THz radiation, we have measured the absorption and dispersion of both N- and P-type, 1 Ω cm silicon from 0.1 to 2 THz. These results give the corresponding frequency-dependent complex conductance over the widest frequency range to date. The data provide a complete view on the dynamics of both electrons and holes and are well fit by the simple Drude relationship.
Stephen E. Ralph, D. Grischkowsky
CLEO 1991
W.J. Gallagher, C.C. Chi, et al.
Applied Physics Letters
D. Grischkowsky, S.R. Hartmann
Physical Review B
D. Krökel, D. Grischkowsky, et al.
Applied Physics Letters