Conference paper
Compression for data archiving and backup revisited
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
We have examined the various fundamental issues that are important for the accurate determination of the ionization probability as a function of the emission velocity. The different surface potentials encountered by the sputtered neutral atoms and the secondary ions respectively result in corrections to both the trajectories of the secondary ions and the phase space covered by the detector. © 1989, Taylor & Francis Group, LLC. All rights reserved.
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
J.R. Thompson, Yang Ren Sun, et al.
Physica A: Statistical Mechanics and its Applications
U. Wieser, U. Kunze, et al.
Physica E: Low-Dimensional Systems and Nanostructures