Conference paper
True 3-D displays for avionics and mission crewstations
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
Some theoretical and practical aspects of common random numbers (CRN) for variance reduction in simulation analysis are considered. A simple proof of the optimality of CRN is presented and the efficiency of this technique for variance reduction is discussed. Applications of CRN to production planning and inventory problems while using stochastic approximation are given. © 1984.
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
Robert F. Gordon, Edward A. MacNair, et al.
WSC 1985
R.B. Morris, Y. Tsuji, et al.
International Journal for Numerical Methods in Engineering
Ligang Lu, Jack L. Kouloheris
IS&T/SPIE Electronic Imaging 2002