Characterization of a next generation step-and-scan system
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
The rearrangement inequality states that the sum of products of permutations of 2 sequences of real numbers are maximized when the terms are similarly ordered and minimized when the terms are ordered in opposite order. We show that similar inequalities exist in algebras of multi-valued logic when the multiplication and addition operations are replaced with various T-norms and T-conorms respectively. For instance, we show that the rearrangement inequality holds when the T-norms and T-conorms are derived from Archimedean copulas.
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
Hans Becker, Frank Schmidt, et al.
Photomask and Next-Generation Lithography Mask Technology 2004
Renu Tewari, Richard P. King, et al.
IS&T/SPIE Electronic Imaging 1996
Sankar Basu
Journal of the Franklin Institute