Conference paper
Min-log approach to modeling dielectric breakdown data
Emmanuel Yashchin, Baozhen Li, et al.
IRPS 2012
We consider situations where the observed data is of categorical type and the underlying parameters are subject to abrupt changes of unpredictable magnitude at unknown points in time. We derive change-point detection schemes based on generalized likelihood ratio tests and develop procedures for their design and analysis. We also discuss problems related to parameter estimation for categorical data in the presence of abrupt changes. We illustrate use of the proposed methodology for fault characterization and monitoring in the semiconductor industry.
Emmanuel Yashchin, Baozhen Li, et al.
IRPS 2012
Emmanuel Yashchin
Technometrics
Michael Baron, Emmanuel Yashchin
Appl Stochastic Models Bus Indus
Emmanuel Yashchin
IWISQC 2016