Peter J. Price
Surface Science
On-chip microstrip transmission lines have been measured on-wafer from below 1 GHz up to 110 GHz. Using different pad de-embedding techniques as well as a technique based on two transmission lines of different length, the characteristic transmission line parameters have been accurately determined. The results are compared against simulation results from an electromagnetic full-wave solution and the parametric IBM model which is available in the technology's design kit.
Peter J. Price
Surface Science
G. Will, N. Masciocchi, et al.
Zeitschrift fur Kristallographie - New Crystal Structures
David B. Mitzi
Journal of Materials Chemistry
D.D. Awschalom, J.-M. Halbout
Journal of Magnetism and Magnetic Materials