PaperReduction of grain boundary recombination in polycrystalline silicon solar cellsT.H. Distefano, J.J. CuomoApplied Physics Letters
PaperBarrier inhomogeneities on a sisingle bond signSiO2 interface by scanning internal photoemissionT.H. DistefanoApplied Physics Letters
PaperElectrical resistivity model for polycrystalline films: The case of specular reflection at external surfacesA.F. Mayadas, M. Shatzkes, et al.Applied Physics Letters
PaperImpact ionization model for dielectric instability and breakdownT.H. Distefano, M. ShatzkesApplied Physics Letters
