On 72-widths inl00

Heinz Koeppl, Marc Hafner, et al.

BMC Bioinformatics

Ruixiong Tian, Zhe Xiang, et al.

Qinghua Daxue Xuebao/Journal of Tsinghua University

John R. Kender, Rick Kjeldsen

IEEE Transactions on Pattern Analysis and Machine Intelligence

Donald Samuels, Ian Stobert

SPIE Photomask Technology + EUV Lithography 2007