P.A. Moskowitz, S.M. Faris, et al.
IEEE Transactions on Magnetics
The time-averaged current induced by incident radiation across electronic tunneling junctions is shown experimentally and theoretically to have a highly nonlinear dependence on the field intensity for a range of tunneling barrier thickness.
P.A. Moskowitz, S.M. Faris, et al.
IEEE Transactions on Magnetics
T.K. Gustafson, P.L. Kelley, et al.
Applied Physics Letters
S.M. Faris, S.I. Raider, et al.
IEEE Transactions on Magnetics
Malcolm C. Gower, T.K. Yee, et al.
IEEE JQE