Rajiv Ramaswami, Kumar N. Sivarajan
IEEE/ACM Transactions on Networking
Paper
Nondestructive Read-Out in Thin Magnetic Film Memories
Abstract
No abstract available.
Related
David A. Selby
IBM J. Res. Dev
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Maciel Zortea, Miguel Paredes, et al.
IGARSS 2021