About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Publication
Applied Physics Letters
Paper
New method for determining the nonlinear optical coefficients of thin films
Abstract
A new scheme for characterizing the quadratic optical nonlinearity of thin films grown on opaque substrates is proposed and demonstrated. This involved the measurement, as a function of the film thickness, of second-harmonic waves reflected from a film surface. The d36 coefficient of a ZnSe-on-GaAs film is estimated by this method to be 33±7 pm/V at the fundamental wavelength of 1.06 μm, which agrees reasonably well with the known value for the bulk crystal.