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Publication
Applied Physics Letters
Paper
Multiple-crystal x-ray topographic characterization of periodically domain-inverted KTiOPO4 crystal
Abstract
A periodically domain-inverted KTiOPO4 crystal has been characterized for the first time by multiple-crystal multiple-reflection x-ray topography. The striation contrast within the domain-inverted regions has been revealed in high strain-sensitivity reflection topographs. The origin of formation of the striation contrast and the mechanism of domain inversion in KTiOPO4 are discussed in terms of the structural characteristics of KTiOPO4.© 1995 American Institute of Physics.