Failure diagnosis with incomplete information in cable networks
Yun Mao, Hani Jamjoom, et al.
CoNEXT 2006
Scanning electron microscope pictures of ground and lapped ferrite (sinfered magnetic ceramic) and steel surfaces and chips are studied and compared. These reveal considerably more plastic action associated with the formation of metal chips in fine grinding than for ferrite chips. Individual chips are an order of magnitude larger for metals than for ferrites. These results are consistent with the much greater specific grinding energy for metals than for ferrites. The depth of the plastically deformed layer beneath a ground surface revealed by etching corresponds closely with the depth of residual surface stress. © 1987 by ASME.
Yun Mao, Hani Jamjoom, et al.
CoNEXT 2006
Hans Becker, Frank Schmidt, et al.
Photomask and Next-Generation Lithography Mask Technology 2004
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Maurice Hanan, Peter K. Wolff, et al.
DAC 1976